(Nanowerk News) Monolayer crystals, often being referred as 2D crystals or 2D materials, possess the unique characteristic of having a single layer of regular atomic structure. And the more regular ...

Defect detection on optical surfaces and semiconductor wafers underpins the manufacture of high‐performance photonic components and integrated circuits. Techniques ...

In this review we discuss two recent CnCV metrology advancements, namely: 1. enhancement of throughput and 2. use of electrical defect mapping for yield prediction. Novel 10x faster measurements of ...

Taiwan-based manufacturer of AI fabric inspection machines shows end-to-end fabric defect detection and data integration from inspection through spreading to cutting NEW TAIPEI CITY, April 30, 2026 ...